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HAST Test Chamber for Highly Accelerated Stress Testing

Key Advantages:

Accelerated stress testing under high temperature and high humidity

Typical test conditions up to 130°C / 85% RH / 2–3 atm pressure

Significant reduction in testing time compared to standard humidity testing

Excellent sealing performance for pressure stability( 0.1 MPa to 0.3 MPa (1–3 atm))

High-precision temperature and humidity control

Compliant with JESD22-A110, JESD22-A102, IEC 60068

Designed for continuous and repeatable reliability testing


Key Specifications of HAST Test Chamber:


Serial
number
Capacity ( m3 )0.0180.0480.0880.199
1 ModelHAST Pressure Accelerated Aging Test ChamberEQ-PCT-18EQ-PCT-48EQ-PCT-88EQ-PCT-199
2Internal Dimensions
(Diameter ×D)mm
Ф300x250Ф450x300Ф500x450Ф650x600
3External Dimension
WxHxD (mm)
500x500x700 580x850x650800x750x900950x900x1100
4Steam Temperature Range +110C to +135℃
5Temperature Fluctuation≤ ± 0.5℃
6Temperature Uniformity≤  1.5℃
7Humidity Range 

100%R.H Saturated vapor

Or: 

70 ~100%R.H (Steam humidity adjustable)

8Humidity Uniformity± 1.5% RH
9Humidity Uniformity± 3.0% RH
10Pressure range0 to +2 kg/cm² (Operational range: 0 to +3 kg/cm²)
Absolute Pressure Range: 1.0-3.0 kg/cm²
Safety Pressure Capacity: 4 kg/cm² Equal to
1 atmospheric pressure + 3 kg/cm² gauge pressure
11Circulation MechanismNatural convection of water vapor
12Test Time SettingProgrammable duration: 0-999 hours
13Pressurization TimeAchieves 0.00→2.00 kg/cm² in ≈30 min
 (non-linear ramp under no-load conditions)
14Temperature Ramp ProfileAmbient→132℃ in ≈30 min
 (air temperature-based control, not product temperature)
15Safety ProtectionsDual-mode Water Management
(Automatic/manual water replenishment, Automatic pressure relief)
Critical Safeguards
(Low-water cutoff protection,Overpressure interlock)
16PowerAC220V; 1phase 3 lines ; 50/60HZ 
           AC380V; 3phase 5 lines ; 50/60HZ

Opening:

The HAST Test Chamber (Highly Accelerated Stress Test Chamber) is designed to evaluate the reliability of electronic components and semiconductor devices under high temperature, high humidity, and high pressure conditions.

By accelerating moisture penetration and chemical reactions, HAST testing helps identify latent defects, corrosion risks, and insulation failures in a significantly reduced time compared to conventional environmental testing.

This chamber is widely used for semiconductor qualification, PCB reliability testing, and electronic component validation.


 What is HAST Testing?

Highly Accelerated Stress Test (HAST) is an advanced environmental testing method that uses elevated temperature, humidity, and pressure to accelerate failure mechanisms.

Compared to traditional 85°C / 85% RH testing, HAST significantly reduces test duration from 1000 hours to tens or hundreds of hours, improving efficiency in product qualification.


HAST vs Temperature Humidity Testing:


FeatureHAST TestingTemperature Humidity Test
TemperatureHigher (110–130°C)Lower (85°C typical)
PressureElevatedNormal
Test TimeShort (hours–days)Long (weeks–months)
ApplicationSemiconductorGeneral electronics

Designed for Semiconductor Reliability:

HAST testing is critical for identifying:

  • Moisture ingress failures

  • Corrosion of metal interconnects

  • Delamination in IC packaging

  • Insulation breakdown

  • Electrochemical migration

It is widely required in JEDEC qualification standards for semiconductor devices.


 Why Choose TestEQ:

  • Specialized in high-end environmental test chambers

  • Proven experience in semiconductor & electronics testing

  • Advanced pressure and sealing system design

  • Stable long-duration operation under extreme conditions

  • Custom engineering support for global standards compliance


 Optional Configurations:

  • Biased HAST (with electrical loading)

  • Unbiased HAST mode

  • Automatic pressure control system

  • Data logging & remote monitoring

  • Multi-sample testing fixtures

  • Custom chamber sizes and layouts


Standards Supported:

1.Global Electronics:

JEDEC JESD22-A110 (HAST), IPC-9701 (Board-Level Reliability).

2.Automotive:

AEC-Q100/101/200, ISO 16750-2 (Humidity Resistance).

3.Military:

MIL-STD-202 (Method 106), MIL-STD-750 (Method 1021).

4.Sustainability:

•Compliant with EU RoHS 2025/09 (hazardous substance limits) and China GB/T 2423.40-2025.


FAQ:

What is a HAST test chamber?

A HAST test chamber is used to perform highly accelerated stress testing under high temperature, humidity, and pressure to evaluate product reliability.


What is the difference between HAST and 85/85 testing?

HAST uses higher temperature and pressure, significantly reducing test time compared to standard 85°C / 85% RH testing.


What industries use HAST testing?

Industries include semiconductor, electronics, automotive, and telecommunications.


What standards does HAST comply with?

It complies with JESD22-A110, JESD22-A102, and IEC 60068 standards.


What is biased vs unbiased HAST?

Biased HAST applies electrical voltage during testing

Unbiased HAST does not apply electrical load

Applications:

The HAST test chamber is widely used in:

  • Semiconductor reliability testing (IC, chips, packaging)

  • PCB and electronic assembly testing

  • Automotive electronics validation

  • LED and optoelectronic device testing

  • Connector and cable reliability testing

  • Moisture resistance and corrosion testing


Call To Action:

"Request a customized HAST testing solution today

Our engineers will help you select the optimal chamber configuration for your application.

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