IEC60068-2-66 Pressure Accelerated Aging Test Chamber (HAST)
Pressure Accelleration aging test chamber -HAST Environmental testing Part 2: Test methods Test Cx: Damp heat, steady state (unsaturated pressurized vapour) PCT Chamber, HAST chamberTEST EQ Pressure accelerated aging test chamber(HAST chamber) strictly follows IEC 68-2-66 international standard, simulates high temperature, high humidity and high pressure environment, accelerates product life test. The Test chamber is equipped with precise temperature and humidity control (105°C-150°C, 75%-100%RH), rapid voltage rise (≤15 minutes), and multiple safety protection systems, making it suitable for reliability verification of semiconductors, PCBS, and electronic components. Through HAST/PCT test chamber , the customer can reduce the traditional 1000-hour aging cycle to 96 hours, significantly improving R&D efficiency and reducing quality inspection costs
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