Key Advantages:
Accelerated stress testing under high temperature and high humidity
Typical test conditions up to 130°C / 85% RH / 2–3 atm pressure
Significant reduction in testing time compared to standard humidity testing
Excellent sealing performance for pressure stability( 0.1 MPa to 0.3 MPa (1–3 atm))
High-precision temperature and humidity control
Compliant with JESD22-A110, JESD22-A102, IEC 60068
Designed for continuous and repeatable reliability testing
Key Specifications of HAST Test Chamber:
| Serial number | Capacity ( m3 ) | 0.018 | 0.048 | 0.088 | 0.199 | |
| 1 | Model | HAST Pressure Accelerated Aging Test Chamber | EQ-PCT-18 | EQ-PCT-48 | EQ-PCT-88 | EQ-PCT-199 |
| 2 | Internal Dimensions (Diameter ×D)mm | Ф300x250 | Ф450x300 | Ф500x450 | Ф650x600 | |
| 3 | External Dimension WxHxD (mm) | 500x500x700 | 580x850x650 | 800x750x900 | 950x900x1100 | |
| 4 | Steam Temperature Range | +110C to +135℃ | ||||
| 5 | Temperature Fluctuation | ≤ ± 0.5℃ | ||||
| 6 | Temperature Uniformity | ≤ 1.5℃ | ||||
| 7 | Humidity Range | 100%R.H Saturated vapor Or: 70 ~100%R.H (Steam humidity adjustable) | ||||
| 8 | Humidity Uniformity | ± 1.5% RH | ||||
| 9 | Humidity Uniformity | ± 3.0% RH | ||||
| 10 | Pressure range | 0 to +2 kg/cm² (Operational range: 0 to +3 kg/cm²) Absolute Pressure Range: 1.0-3.0 kg/cm² Safety Pressure Capacity: 4 kg/cm² Equal to 1 atmospheric pressure + 3 kg/cm² gauge pressure | ||||
| 11 | Circulation Mechanism | Natural convection of water vapor | ||||
| 12 | Test Time Setting | Programmable duration: 0-999 hours | ||||
| 13 | Pressurization Time | Achieves 0.00→2.00 kg/cm² in ≈30 min (non-linear ramp under no-load conditions) | ||||
| 14 | Temperature Ramp Profile | Ambient→132℃ in ≈30 min (air temperature-based control, not product temperature) | ||||
| 15 | Safety Protections | Dual-mode Water Management (Automatic/manual water replenishment, Automatic pressure relief) Critical Safeguards （Low-water cutoff protection，Overpressure interlock） | ||||
| 16 | Power | AC220V; 1phase 3 lines ; 50/60HZ AC380V; 3phase 5 lines ; 50/60HZ | ||||
Opening:
The HAST Test Chamber (Highly Accelerated Stress Test Chamber) is designed to evaluate the reliability of electronic components and semiconductor devices under high temperature, high humidity, and high pressure conditions.
By accelerating moisture penetration and chemical reactions, HAST testing helps identify latent defects, corrosion risks, and insulation failures in a significantly reduced time compared to conventional environmental testing.
This chamber is widely used for semiconductor qualification, PCB reliability testing, and electronic component validation.
What is HAST Testing?
Highly Accelerated Stress Test (HAST) is an advanced environmental testing method that uses elevated temperature, humidity, and pressure to accelerate failure mechanisms.
Compared to traditional 85°C / 85% RH testing, HAST significantly reduces test duration from 1000 hours to tens or hundreds of hours, improving efficiency in product qualification.
HAST vs Temperature Humidity Testing:
| Feature | HAST Testing | Temperature Humidity Test |
|---|---|---|
| Temperature | Higher (110–130°C) | Lower (85°C typical) |
| Pressure | Elevated | Normal |
| Test Time | Short (hours–days) | Long (weeks–months) |
| Application | Semiconductor | General electronics |
Designed for Semiconductor Reliability:
HAST testing is critical for identifying:
Moisture ingress failures
Corrosion of metal interconnects
Delamination in IC packaging
Insulation breakdown
Electrochemical migration
It is widely required in JEDEC qualification standards for semiconductor devices.
Why Choose TestEQ:
Specialized in high-end environmental test chambers
Proven experience in semiconductor & electronics testing
Advanced pressure and sealing system design
Stable long-duration operation under extreme conditions
Custom engineering support for global standards compliance
Optional Configurations:
Biased HAST (with electrical loading)
Unbiased HAST mode
Automatic pressure control system
Data logging & remote monitoring
Multi-sample testing fixtures
Custom chamber sizes and layouts
Standards Supported:
1.Global Electronics:
•JEDEC JESD22-A110 (HAST), IPC-9701 (Board-Level Reliability).
2.Automotive:
•AEC-Q100/101/200, ISO 16750-2 (Humidity Resistance).
3.Military:
•MIL-STD-202 (Method 106), MIL-STD-750 (Method 1021).
4.Sustainability:
•Compliant with EU RoHS 2025/09 (hazardous substance limits) and China GB/T 2423.40-2025.
Internal Linking Module
Recommended Equipment
A standard environmental chamber designed for temperature and humidity reliability testing. It is widely used for 85°C/85% RH aging tests and long-term moisture resistance evaluation of electronic components.
Designed for Environmental Stress Screening (ESS), this system helps identify latent defects in electronics and semiconductor products through accelerated thermal cycling and environmental stress testing.
Related Standards
A complete guide to the JEDEC JESD22-A110 standard, covering HAST test conditions, failure mechanisms, pressure requirements, and semiconductor qualification procedures.
Learn the fundamentals of IEC 60068 environmental testing methods for temperature, humidity, vibration, and combined stress reliability evaluation.
Technical Resources
Understand how Highly Accelerated Stress Testing works and how HAST chambers accelerate moisture-induced failures for semiconductor and electronics reliability validation.
Compare HAST and Temperature Humidity Bias (THB) testing in terms of pressure, duration, failure mechanisms, and application scenarios to select the right reliability test method.
FAQ:
1. What is a HAST test chamber?
A HAST test chamber is used to perform highly accelerated stress testing under high temperature, humidity, and pressure to evaluate product reliability.
2. What is the difference between HAST and 85/85 testing?
HAST uses higher temperature and pressure, significantly reducing test time compared to standard 85°C / 85% RH testing.
3. What industries use HAST testing?
Industries include semiconductor, electronics, automotive, and telecommunications.
4. What standards does HAST comply with?
It complies with JESD22-A110, JESD22-A102, and IEC 60068 standards.
5. What is biased vs unbiased HAST?
Biased HAST applies electrical voltage during testing
Unbiased HAST does not apply electrical load
Applications:
The HAST test chamber is widely used in:
Semiconductor reliability testing (IC, chips, packaging)
PCB and electronic assembly testing
Automotive electronics validation
LED and optoelectronic device testing
Connector and cable reliability testing
Call To Action:
Need Help Choosing Between HAST and THB Testing?
Our engineers can help you select the appropriate test method and chamber configuration based on your products, standards, and reliability requirements.
Get Expert Advice from TestEQ
Customized HAST and THB chamber solutions
Temperature range up to 150°C and humidity control up to 100% RH
Compliance with JEDEC and IEC standards
OEM and turnkey laboratory projects available
We will contact you within 1 working day, please pay attention to the email with
the suffix "@test-eq.com".
We will contact you within 1 working day, please pay attention to the email with the suffix "@test-eq.com".
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